Extracting the relative dielectric constant for high-kappa layers from CV measurements - Errors and error propagation - researchr publication authors

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Octavian Buiu, Steve Hall, O. Engstrom, B. Raeissi, M. Lemme, P. K. Hurley, K. Cherkaoui. Extracting the relative dielectric constant for high-kappa layers from CV measurements - Errors and error propagation. Microelectronics Reliability, 47(4-5):678-681, 2007. [doi]

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