Octavian Buiu, Steve Hall, O. Engstrom, B. Raeissi, M. Lemme, P. K. Hurley, K. Cherkaoui. Extracting the relative dielectric constant for high-kappa layers from CV measurements - Errors and error propagation. Microelectronics Reliability, 47(4-5):678-681, 2007. [doi]
@article{BuiuHERLHC07,
title = {Extracting the relative dielectric constant for high-kappa layers from CV measurements - Errors and error propagation},
author = {Octavian Buiu and Steve Hall and O. Engstrom and B. Raeissi and M. Lemme and P. K. Hurley and K. Cherkaoui},
year = {2007},
doi = {10.1016/j.microrel.2007.01.006},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.006},
researchr = {https://researchr.org/publication/BuiuHERLHC07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {678-681},
}