Band-gap circuit design challenges in high-performance 32-nm technology

J. F. Buller, J. Fletcher, S. Meyers, M. Robinson, F. Tamayo, A. Prakash, D. Cabler. Band-gap circuit design challenges in high-performance 32-nm technology. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-4, IEEE, 2011. [doi]

Abstract

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