How an Evolving Fault Model Improves the Behavioral Test Generation - researchr publication authors

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Giacomo Buonanno, Fabrizio Ferrandi, L. Ferrandi, Franco Fummi, Donatella Sciuto. How an Evolving Fault Model Improves the Behavioral Test Generation. In 7th Great Lakes Symposium on VLSI (GLS-VLSI 97), 13-15 March 1997, Urbana, IL, USA. pages 124, IEEE Computer Society, 1997. [doi]

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