Giacomo Buonanno, Fabrizio Ferrandi, L. Ferrandi, Franco Fummi, Donatella Sciuto. How an Evolving Fault Model Improves the Behavioral Test Generation. In 7th Great Lakes Symposium on VLSI (GLS-VLSI 97), 13-15 March 1997, Urbana, IL, USA. pages 124, IEEE Computer Society, 1997. [doi]
@inproceedings{BuonannoFFFS97,
title = {How an Evolving Fault Model Improves the Behavioral Test Generation},
author = {Giacomo Buonanno and Fabrizio Ferrandi and L. Ferrandi and Franco Fummi and Donatella Sciuto},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/glsvlsi/1997/7904/00/79040124abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/BuonannoFFFS97},
cites = {0},
citedby = {0},
pages = {124},
booktitle = {7th Great Lakes Symposium on VLSI (GLS-VLSI 97), 13-15 March 1997, Urbana, IL, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-7904-2},
}