Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy

Daniel J. Burns, Georg Ernest Fantner, Kamal Youcef-Toumi. Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy. In American Control Conference, ACC 2012, Montreal, QC, Canada, June 27-29, 2012. pages 3240-3246, IEEE, 2012. [doi]

@inproceedings{BurnsFY12,
  title = {Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy},
  author = {Daniel J. Burns and Georg Ernest Fantner and Kamal Youcef-Toumi},
  year = {2012},
  url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6315085},
  researchr = {https://researchr.org/publication/BurnsFY12},
  cites = {0},
  citedby = {0},
  pages = {3240-3246},
  booktitle = {American Control Conference, ACC 2012, Montreal, QC, Canada, June 27-29, 2012},
  publisher = {IEEE},
  isbn = {978-1-4577-1095-7},
}