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Intelligent Fault Localization in Software

Ilene Burnstein, Nitya Jani, Steve Mannina, Joe Tamsevicius, Michael Goldshteyn, Louis Lendi. Intelligent Fault Localization in Software. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 917-926, IEEE Computer Society, 1992.

Authors

Ilene Burnstein

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Nitya Jani

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Steve Mannina

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Joe Tamsevicius

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Michael Goldshteyn

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Louis Lendi

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