Ilene Burnstein, Nitya Jani, Steve Mannina, Joe Tamsevicius, Michael Goldshteyn, Louis Lendi. Intelligent Fault Localization in Software. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 917-926, IEEE Computer Society, 1992.
@inproceedings{BurnsteinJMTGL92,
title = {Intelligent Fault Localization in Software},
author = {Ilene Burnstein and Nitya Jani and Steve Mannina and Joe Tamsevicius and Michael Goldshteyn and Louis Lendi},
year = {1992},
researchr = {https://researchr.org/publication/BurnsteinJMTGL92},
cites = {0},
citedby = {0},
pages = {917-926},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}