Erik Bury, Adrian Chasin, Ben Kaczer, Kai-Hsin Chuang, Jacopo Franco, Marco Simicic, Pieter Weckx, Dimitri Linten. Self-heating-aware CMOS reliability characterization using degradation maps. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 2, IEEE, 2018. [doi]
Abstract is missing.