IGBT modules robustness during turn-off commutation

G. Busatto, Carmine Abbate, B. Abbate, Francesco Iannuzzo. IGBT modules robustness during turn-off commutation. Microelectronics Reliability, 48(8-9):1435-1439, 2008. [doi]

Authors

G. Busatto

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Carmine Abbate

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B. Abbate

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Francesco Iannuzzo

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