G. Busatto, Carmine Abbate, B. Abbate, Francesco Iannuzzo. IGBT modules robustness during turn-off commutation. Microelectronics Reliability, 48(8-9):1435-1439, 2008. [doi]
@article{BusattoAAI08,
title = {IGBT modules robustness during turn-off commutation},
author = {G. Busatto and Carmine Abbate and B. Abbate and Francesco Iannuzzo},
year = {2008},
doi = {10.1016/j.microrel.2008.07.027},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.027},
researchr = {https://researchr.org/publication/BusattoAAI08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1435-1439},
}