Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen. Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 161-164, IEEE, 2011. [doi]
@inproceedings{BusscheWMG11,
title = {Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS},
author = {Simon Vanden Bussche and Pieter De Wit and Elie Maricau and Georges G. E. Gielen},
year = {2011},
doi = {10.1109/ICECS.2011.6122239},
url = {http://dx.doi.org/10.1109/ICECS.2011.6122239},
researchr = {https://researchr.org/publication/BusscheWMG11},
cites = {0},
citedby = {0},
pages = {161-164},
booktitle = {18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1845-8},
}