Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen. Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 161-164, IEEE, 2011. [doi]
Abstract is missing.