Multidimensional Test Escape Rate Modeling - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch. Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers, 26(5):74-82, 2009. [doi]

This author has not been identified. Look up 'Kenneth M. Butler' in GoogleThis author has not been identified. Look up 'John M. Carulli Jr.' in GoogleThis author has not been identified. Look up 'Jayashree Saxena' in GoogleThis author has not been identified. Look up 'Amit Nahar' in GoogleThis author has not been identified. Look up 'W. Robert Daasch' in Google

runs on WebDSL