Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch. Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers, 26(5):74-82, 2009. [doi]
@article{ButlerCSND09,
title = {Multidimensional Test Escape Rate Modeling},
author = {Kenneth M. Butler and John M. Carulli Jr. and Jayashree Saxena and Amit Nahar and W. Robert Daasch},
year = {2009},
doi = {10.1109/MDT.2009.118},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.118},
tags = {modeling, testing},
researchr = {https://researchr.org/publication/ButlerCSND09},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {26},
number = {5},
pages = {74-82},
}