Theoretical Analysis on Noise Performance of Modulated Wideband Converters for Analog Testing

Zolboo Byambadorj, Koji Asami, Takahiro J. Yamaguchi, Akio Higo, Masahiro Fujita, Tetsuya Iizuka. Theoretical Analysis on Noise Performance of Modulated Wideband Converters for Analog Testing. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

Abstract is missing.