Younghoon Byun, Minho Ha, Jeonghun Kim, Sunggu Lee, Youngjoo Lee. Low-Complexity Dynamic Channel Scaling of Noise-Resilient CNN for Intelligent Edge Devices. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 114-119, IEEE, 2019. [doi]
@inproceedings{ByunHKLL19,
title = {Low-Complexity Dynamic Channel Scaling of Noise-Resilient CNN for Intelligent Edge Devices},
author = {Younghoon Byun and Minho Ha and Jeonghun Kim and Sunggu Lee and Youngjoo Lee},
year = {2019},
doi = {10.23919/DATE.2019.8715280},
url = {https://doi.org/10.23919/DATE.2019.8715280},
researchr = {https://researchr.org/publication/ByunHKLL19},
cites = {0},
citedby = {0},
pages = {114-119},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
publisher = {IEEE},
isbn = {978-3-9819263-2-3},
}