Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu. Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives. Proceedings of the IEEE, 105(9):1666-1704, 2017. [doi]
@article{CaiGHLM17,
title = {Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives},
author = {Yu Cai and Saugata Ghose and Erich F. Haratsch and Yixin Luo and Onur Mutlu},
year = {2017},
doi = {10.1109/JPROC.2017.2713127},
url = {https://doi.org/10.1109/JPROC.2017.2713127},
researchr = {https://researchr.org/publication/CaiGHLM17},
cites = {0},
citedby = {0},
journal = {Proceedings of the IEEE},
volume = {105},
number = {9},
pages = {1666-1704},
}