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Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu. Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives. Proceedings of the IEEE, 105(9):1666-1704, 2017. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: FPGA-based nand flash memory error characterization and solid-state drive prototyping platform (abstract only)Yu Cai, Erich F. Haratsch, Mark McCartney, Mudit Bhargava, Ken Mai. fpga 2011: 284 [doi] Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and RecoveryYu Cai, Yixin Luo, Saugata Ghose, Onur Mutlu. dsn 2015: 438-449 [doi]
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