Analysis of BTI aging of level shifters

Jiajing Cai, Basel Halak, Daniele Rossi. Analysis of BTI aging of level shifters. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 17-18, IEEE, 2016. [doi]

Abstract

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