Reliability Emphasized MTJ/CMOS Hybrid Circuit Towards Ultra-Low Power

Hao Cai, Menglin Han, You Wang, Lirida A. B. Naviner, Xinning Liu, Jun Yang, Weisheng Zhao. Reliability Emphasized MTJ/CMOS Hybrid Circuit Towards Ultra-Low Power. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018. pages 1-5, IEEE, 2018. [doi]

Abstract

Abstract is missing.