Data retention in MLC NAND flash memory: Characterization, optimization, and recovery - researchr publication authors

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Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu. Data retention in MLC NAND flash memory: Characterization, optimization, and recovery. In 21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA, February 7-11, 2015. pages 551-563, IEEE, 2015. [doi]

This author has not been identified. Look up 'Yu Cai' in GoogleThis author has not been identified. Look up 'Yixin Luo' in GoogleThis author has not been identified. Look up 'Erich F. Haratsch' in GoogleThis author has not been identified. Look up 'Ken Mai' in GoogleThis author has not been identified. It may be one of the following persons:

Onur Mutlu

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