Reliability-aware delay faults evaluation of CMOS flip-flops - researchr publication authors

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Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner. Reliability-aware delay faults evaluation of CMOS flip-flops. In Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2014, Lviv, Ukraine, June 19-21, 2014. pages 385-389, IEEE, 2014. [doi]

This author has not been identified. Look up 'Hao Cai' in GoogleThis author has not been identified. Look up 'Kaikai Liu' in GoogleThis author has not been identified. Look up 'Lirida Alves de Barros Naviner' in Google

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