Reliability-aware delay faults evaluation of CMOS flip-flops

Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner. Reliability-aware delay faults evaluation of CMOS flip-flops. In Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2014, Lviv, Ukraine, June 19-21, 2014. pages 385-389, IEEE, 2014. [doi]

@inproceedings{CaiLN14-0,
  title = {Reliability-aware delay faults evaluation of CMOS flip-flops},
  author = {Hao Cai and Kaikai Liu and Lirida Alves de Barros Naviner},
  year = {2014},
  doi = {10.1109/MIXDES.2014.6872224},
  url = {https://doi.org/10.1109/MIXDES.2014.6872224},
  researchr = {https://researchr.org/publication/CaiLN14-0},
  cites = {0},
  citedby = {0},
  pages = {385-389},
  booktitle = {Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2014, Lviv, Ukraine, June 19-21, 2014},
  publisher = {IEEE},
}