Reliability-aware delay faults evaluation of CMOS flip-flops

Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner. Reliability-aware delay faults evaluation of CMOS flip-flops. In Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2014, Lviv, Ukraine, June 19-21, 2014. pages 385-389, IEEE, 2014. [doi]

Abstract

Abstract is missing.