Yongming Cai, T. P. Warwick, Sunil G. Rane, E. Masserrat. Digital serial communication device testing and its implications on automatic test equipment architecture. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 600-609, IEEE Computer Society, 2000.
@inproceedings{CaiWRM00,
title = {Digital serial communication device testing and its implications on automatic test equipment architecture},
author = {Yongming Cai and T. P. Warwick and Sunil G. Rane and E. Masserrat},
year = {2000},
tags = {architecture, testing, e-science},
researchr = {https://researchr.org/publication/CaiWRM00},
cites = {0},
citedby = {0},
pages = {600-609},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}