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Digital serial communication device testing and its implications on automatic test equipment architecture

Yongming Cai, T. P. Warwick, Sunil G. Rane, E. Masserrat. Digital serial communication device testing and its implications on automatic test equipment architecture. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 600-609, IEEE Computer Society, 2000.

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