Shuo Cai, Caicai Xie, Yan Wen, Weizheng Wang. A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.