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On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces

Yenisel Plasencia Calana, Edel B. García Reyes, Robert P. W. Duin, Mauricio Orozco-Alzate. On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces. In Luis Álvarez, Marta Mejail, Luis Gómez, Julio C. Jacobo, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings. Volume 7441 of Lecture Notes in Computer Science, pages 503-510, Springer, 2012. [doi]

Authors

Yenisel Plasencia Calana

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Edel B. García Reyes

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Robert P. W. Duin

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Mauricio Orozco-Alzate

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