Yenisel Plasencia Calana, Edel B. García Reyes, Robert P. W. Duin, Mauricio Orozco-Alzate. On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces. In Luis Álvarez, Marta Mejail, Luis Gómez, Julio C. Jacobo, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings. Volume 7441 of Lecture Notes in Computer Science, pages 503-510, Springer, 2012. [doi]
@inproceedings{CalanaRDO12,
title = {On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces},
author = {Yenisel Plasencia Calana and Edel B. García Reyes and Robert P. W. Duin and Mauricio Orozco-Alzate},
year = {2012},
doi = {10.1007/978-3-642-33275-3_62},
url = {http://dx.doi.org/10.1007/978-3-642-33275-3_62},
researchr = {https://researchr.org/publication/CalanaRDO12},
cites = {0},
citedby = {0},
pages = {503-510},
booktitle = {Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings},
editor = {Luis Álvarez and Marta Mejail and Luis Gómez and Julio C. Jacobo},
volume = {7441},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-33274-6},
}