Yenisel Plasencia Calana, Edel B. García Reyes, Robert P. W. Duin, Mauricio Orozco-Alzate. On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces. In Luis Álvarez, Marta Mejail, Luis Gómez, Julio C. Jacobo, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings. Volume 7441 of Lecture Notes in Computer Science, pages 503-510, Springer, 2012. [doi]
Abstract is missing.