Qualification and Quantification of Process-Induced Product-Related Defects - researchr publication

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F. Camerik, P. A. J. Dirks, Jochen A. G. Jess. Qualification and Quantification of Process-Induced Product-Related Defects. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 643-652, IEEE Computer Society, 1989.

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