Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone. Cumulative embedded memory failure bitmap display & analysis. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 255-260, IEEE, 2010. [doi]
Abstract is missing.