Jorge Campos, Hussain Al-Asaad. Circuit Profiling Mechanisms for High-Level {ATPG}. In Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra, editors, Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA. pages 9-14, IEEE Computer Society, 2006. [doi]
@inproceedings{CamposA06,
title = {Circuit Profiling Mechanisms for High-Level {ATPG}},
author = {Jorge Campos and Hussain Al-Asaad},
year = {2006},
doi = {10.1109/MTV.2006.6},
url = {http://doi.ieeecomputersociety.org/10.1109/MTV.2006.6},
researchr = {https://researchr.org/publication/CamposA06},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA},
editor = {Magdy S. Abadir and Li-C. Wang and Jayanta Bhadra},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2839-7},
}