Abstract is missing.
- Program Committee [doi]
- Workshop Organizing Committee [doi]
- Acknowledgement [doi]
- Preface [doi]
- Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive ApplicationsPaolo Bernardi, Leticia Maria Veiras Bolzani, Alberto Manzone, Marcella Guagliumi Massimo Osella, Massimo Violante, Matteo Sonza Reorda. 3-8 [doi]
- Circuit Profiling Mechanisms for High-Level {ATPG}Jorge Campos, Hussain Al-Asaad. 9-14 [doi]
- Functional Test Selection for High Volume ManufacturingVijay Gangaram, Deepa Bhan, James K. Caldwell. 15-19 [doi]
- Test Calculation for Logic and Delay Faults in Digital CircuitsJozsef Sziray. 20-32 [doi]
- Directed Micro-architectural Test Generation for an Industrial Processor: A Case StudyHeon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy S. Abadir. 33-36 [doi]
- Advanced SAT-Techniques for Bounded Model Checking of Blackbox DesignsMarc Herbstritt, Bernd Becker, Christoph Scholl. 37-44 [doi]
- Embedded Software Validation: Applying Formal Techniques for Coverage and Test GenerationTamarah Arons, Elad Elster, Terry Murphy, Eli Singerman. 45-51 [doi]
- Challenges in System on Chip VerificationNoah Bamford, Rekha Bangalore, Eric Chapman, Hector Chavez, Rajeev Dasari, Yinfang Lin, Edgar Jimenez. 52-60 [doi]
- Workload Slicing for Characterizing New Features in High Performance MicroprocessorsHassan Al-Sukhni, David Lindberg, James Holt, Michele Reese. 61-67 [doi]
- Deep vs. Shallow, Kernel vs. Language--What is Better for Heterogeneous Modeling in {SystemC}?Hiren D. Patel, Sandeep K. Shukla. 68-75 [doi]
- Statistical Static Timing Analysis Considering the Impact of Power Supply Noise in {VLSI} CircuitsHyun-Sung Kim, D. M. H. Walker. 76-82 [doi]
- Debug Support for Scalable System-on-ChipJianmin Zhang, Ming Yan, Sikun Li. 83-87 [doi]
- Abstraction and Refinement Techniques in Automated Design DebuggingSean Safarpour, Andreas G. Veneris. 88-93 [doi]
- Diagnosing Silicon Failures Based on Functional Test PatternsChia-Chih Yen, Ten Lin, Hermes Lin, Kai Yang, Ta-Yung Liu, Yu-Chin Hsu. 94-98 [doi]