Hyun-Sung Kim, D. M. H. Walker. Statistical Static Timing Analysis Considering the Impact of Power Supply Noise in {VLSI} Circuits. In Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra, editors, Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA. pages 76-82, IEEE Computer Society, 2006. [doi]
Abstract is missing.