Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing - researchr publication related

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António Canelas, Ricardo Martins, Ricardo Povoa, Nuno Lourenço 0003, Nuno Horta. Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1201-1206, IEEE, 2017. [doi]

The following publications are possibly variants of this publication:

c-Means Analog IC Yield Optimization Using Evolutionary-Based AlgorithmsAntónio Canelas, Ricardo Póvoa, Ricardo Martins 0003, Nuno Lourenço 0003, Jorge Guilherme, João Paulo Carvalho, Nuno Horta. tcad, 39(1):1-13, 2020. [doi]

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