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In-Situ Defect Detection of Metal Additive Manufacturing: An Integrated Framework

Davide Cannizzaro, Antonio Giuseppe Varrella, Stefano Paradiso, Roberta Sampieri, Yukai Chen, Alberto Macii, Edoardo Patti, Santa Di Cataldo. In-Situ Defect Detection of Metal Additive Manufacturing: An Integrated Framework. IEEE Trans. Emerging Topics Comput., 10(1):74-86, 2022. [doi]

Authors

Davide Cannizzaro

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Antonio Giuseppe Varrella

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Stefano Paradiso

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Roberta Sampieri

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Yukai Chen

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Alberto Macii

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Edoardo Patti

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Santa Di Cataldo

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