Davide Cannizzaro, Antonio Giuseppe Varrella, Stefano Paradiso, Roberta Sampieri, Yukai Chen, Alberto Macii, Edoardo Patti, Santa Di Cataldo. In-Situ Defect Detection of Metal Additive Manufacturing: An Integrated Framework. IEEE Trans. Emerging Topics Comput., 10(1):74-86, 2022. [doi]
Abstract is missing.