Davide Cannizzaro, Antonio Giuseppe Varrella, Stefano Paradiso, Roberta Sampieri, Yukai Chen, Alberto Macii, Edoardo Patti, Santa Di Cataldo. In-Situ Defect Detection of Metal Additive Manufacturing: An Integrated Framework. IEEE Trans. Emerging Topics Comput., 10(1):74-86, 2022. [doi]
@article{CannizzaroVPSCM22,
title = {In-Situ Defect Detection of Metal Additive Manufacturing: An Integrated Framework},
author = {Davide Cannizzaro and Antonio Giuseppe Varrella and Stefano Paradiso and Roberta Sampieri and Yukai Chen and Alberto Macii and Edoardo Patti and Santa Di Cataldo},
year = {2022},
doi = {10.1109/TETC.2021.3108844},
url = {https://doi.org/10.1109/TETC.2021.3108844},
researchr = {https://researchr.org/publication/CannizzaroVPSCM22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Emerging Topics Comput.},
volume = {10},
number = {1},
pages = {74-86},
}