Riccardo Cantoro, Nikolaos I. Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea. Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.