Abstract is missing.
- Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevationGlenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren. 1-4 [doi]
- Reliability Evaluation of Pruned Neural Networks against Errors on ParametersZhen Gao, Xiaohui Wei, Han Zhang, Wenshuo Li, Guangjun Ge, Yu Wang 0002, Pedro Reviriego. 1-6 [doi]
- Validation Challenges in Recent Trends of Power Management in MicroprocessorsNagabhushan Reddy, Sankaran Menon, Prashant D. Joshi. 1-6 [doi]
- On the Analysis of Real-time Operating System Reliability in Embedded SystemsDario Mamone, Alberto Bosio, Alessandro Savino, Said Hamdioui, Maurizio Rebaudengo. 1-6 [doi]
- Efficient LDPC Encoder Designs for Magnetic Recording MediaDimitris Theodoropoulos, Nektarios Kranitis, Antonis Tsigkanos, Antonios Paschalis. 1-6 [doi]
- You can detect but you cannot hide: Fault Assisted Side Channel Analysis on Protected Software-based Block CiphersAthanasios Papadimitriou, Konstantinos Nomikos, Mihalis Psarakis, Ehsan Aerabi, David Hély. 1-6 [doi]
- Variation-Aware Test for Logic Interconnects using Neural Networks - A Case StudyAlexander Sprenger, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand. 1-6 [doi]
- Radiation Hardening Legalisation Satisfying TMR Spacing Constraints with Respect to HPWLChristos Georgakidis, Christos P. Sotiriou. 1-6 [doi]
- Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing SystemsLucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez 0001, Alberto Bosio, Luigi Dilillo. 1-6 [doi]
- Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power DomainsPayam Habiby, Sebastian Huhn 0001, Rolf Drechsler. 1-6 [doi]
- A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSATRyuki Asami, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai. 1-6 [doi]
- A novel Network-on-Chip security algorithm for tolerating Byzantine faultsSoultana Ellinidou, Gaurav Sharma 0006, Olivier Markowitch, Guy Gogniat, Jean-Michel Dricot. 1-6 [doi]
- Software-only based Diverse Redundancy for ASIL-D Automotive Applications on Embedded HPC PlatformsSergi Alcaide, Leonidas Kosmidis, Carles Hernández, Jaume Abella. 1-4 [doi]
- A Modelling Attack Resistant Low Overhead Memristive Physical Unclonable FunctionXiaohan Yang, Saurabh Khandelwal, Aiqi Jiang, Abusaleh M. Jabir. 1-4 [doi]
- Sensing with Memristive Complementary Resistive Switch: Modelling and SimulationsVishal Gupta, Danilo Pellegrini, Saurabh Khandelwal, Abusaleh M. Jabir, Shahar Kvatinsky, Eugenio Martinelli, Corrado Di Natale, Marco Ottavi. 1-6 [doi]
- A Lightweight Reconfigurable RRAM-based PUF for Highly Secure ApplicationsBasma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza. 1-4 [doi]
- Fault resilience analysis of a RISC-V microprocessor design through a dedicated UVM environmentMarcello Barbirotta, Antonio Mastrandrea, Francesco Menichelli, Francesco Vigli, Luigi Blasi, Abdallah Cheikh, Stefano Sordillo, Fabio Di Gennaro, Mauro Olivieri. 1-6 [doi]
- Latest Trends in Hardware Security and PrivacyGiorgio Di Natale, Francesco Regazzoni 0001, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini. 1-4 [doi]
- Clock Glitch versus SIFAAein Rezaei Shahmirzadi, Amir Moradi 0001. 1-6 [doi]
- On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore ProcessorDanilo Cappellone, Stefano Di Mascio, Gianluca Furano, Alessandra Menicucci, Marco Ottavi. 1-6 [doi]
- Evaluating Data Encryption Effects on the Resilience of an Artificial Neural NetworkRiccardo Cantoro, Nikolaos I. Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea. 1-4 [doi]
- Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number GenerationHussein Bazzi, Jérémy Postel-Pellerin, Hassen Aziza, Mathieu Moreau, Adnan Harb. 1-4 [doi]
- Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event PredictionJ. Chen, T. Lange, Marko S. Andjelkovic, Aleksandar Simevski, Milos Krstic. 1-6 [doi]
- An Emulation Platform for Evaluating the Reliability of Deep Neural NetworksCorrado De Sio, Sarah Azimi, Luca Sterpone. 1-4 [doi]
- A Pipelined Multi-Level Fault Injector for Deep Neural NetworksAnnachiara Ruospo, Angelo Balaara, Alberto Bosio, Ernesto Sánchez 0001. 1-6 [doi]
- Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive FaultsIrith Pomeranz. 1-4 [doi]
- Reducing DFT hardware overhead by use of a test microprogram in a microprogrammed hardware acceleratorMaryam Rajabalipanah, Seyedeh Maryam Ghasemi, Nooshin Nosrati, Katayoon Basharkhah, Saba Yousefzadeh, Zainalabedin Navabi. 1-4 [doi]
- 2D Error Correction for F/F based Arrays using In-Situ Real-Time Error Detection (RTD)Yiannakis Sazeides, Arkady Bramnik, Ron Gabor, Chrysostomos Nicopoulos, Ramon Canal, Dimitris Konstantinou, Giorgos Dimitrakopoulos. 1-4 [doi]
- Impact of Layers Selective Approximation on CNNs Reliability and PerformanceRubens Luiz Rech, Paolo Rech. 1-4 [doi]
- AI in space: applications examples and challengesGianluca Furano, Antonis Tavoularis, Marco Rovatti. 1-6 [doi]
- Lightweight Fault Detection and Management for Image RestorationCristiana Bolchini, Luca Cassano, Antonio Miele, Matteo Biasielli. 1-6 [doi]
- Markov Chain-based Modeling and Analysis of Checkpointing with Rollback Recovery for Efficient DSE in Soft Real-time SystemsSiva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar 0001. 1-6 [doi]
- Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited CircuitsAvijit Chakraborty, D. M. H. Walker. 1-4 [doi]
- Reliable Classification with Ensemble Convolutional Neural NetworksZhen Gao, Han Zhang, Xiaohui Wei, Tong Yan, Kangkang Guo, Wenshuo Li, Yu Wang, Pedro Reviriego. 1-4 [doi]
- EVM measurement of RF ZigBee transceivers using standard digital ATET. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre. 1-6 [doi]