Marcello Barbirotta, Antonio Mastrandrea, Francesco Menichelli, Francesco Vigli, Luigi Blasi, Abdallah Cheikh, Stefano Sordillo, Fabio Di Gennaro, Mauro Olivieri. Fault resilience analysis of a RISC-V microprocessor design through a dedicated UVM environment. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.