Nagabhushan Reddy, Sankaran Menon, Prashant D. Joshi. Validation Challenges in Recent Trends of Power Management in Microprocessors. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.