Zhen Gao, Xiaohui Wei, Han Zhang, Wenshuo Li, Guangjun Ge, Yu Wang 0002, Pedro Reviriego. Reliability Evaluation of Pruned Neural Networks against Errors on Parameters. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.