Zhen Gao, Han Zhang, Xiaohui Wei, Tong Yan, Kangkang Guo, Wenshuo Li, Yu Wang, Pedro Reviriego. Reliable Classification with Ensemble Convolutional Neural Networks. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.