Rubens Luiz Rech, Paolo Rech. Impact of Layers Selective Approximation on CNNs Reliability and Performance. In Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.