Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero. Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.