Riccardo Cantoro, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{CantoroSRAP23,
title = {Evaluating the Impact of Aging on Path-Delay Self-Test Libraries},
author = {Riccardo Cantoro and Sandro Sartoni and Matteo Sonza Reorda and Lorena Anghel and Michele Portolan},
year = {2023},
doi = {10.1109/DFT59622.2023.10313531},
url = {https://doi.org/10.1109/DFT59622.2023.10313531},
researchr = {https://researchr.org/publication/CantoroSRAP23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023},
editor = {Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio},
publisher = {IEEE},
isbn = {979-8-3503-1500-4},
}