Riccardo Cantoro, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.